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1

‘‘Nintendo’’

Ghidini, Gustavo

Journal:

IIC - International Review of Intellectual Property and Competition Law

Année:

2014

Langue:

english

Fichier:

PDF, 108 KB

english, 2014

2

A Comparative Study of Fashion and IP: Non-traditional Trademarks in Italy and Australia

Ciani, Jacopo, Ghidini, Gustavo, Atkinson, Violet, van Caenegem, William

Journal:

IIC - International Review of Intellectual Property and Competition Law

Année:

2019

Langue:

english

Fichier:

PDF, 413 KB

english, 2019

3

TRIPS and Developing Countries ||

Ghidini, Gustavo, Peritz, Rudolph, Ricolfi, Marco

Année:

2014

Langue:

english

Fichier:

PDF, 1.64 MB

english, 2014

4

Biotechnology and Software Patent Law ||

Arezzo, Emanuela, Ghidini, Gustavo

Année:

2011

Langue:

english

Fichier:

PDF, 1.84 MB

english, 2011

5

Kritika: Essays on Intellectual Property ||

Drahos, Peter, Ghidini, Gustavo, Ullrich, Hanns

Année:

2015

Langue:

english

Fichier:

PDF, 1.91 MB

english, 2015

6

In situ steam generation (ISSG) versus standard steam technology: impact on oxide reliability

M. Langenbuch, R. Bottini, M.E. Vitali, G. Ghidini

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 318 KB

english, 2005

7

Theories and uses of context in knowledge representation and reasoning

Paolo Bouquet, Chiara Ghidini, Fausto Giunchiglia, Enrico Blanzieri

Journal:

Journal of Pragmatics

Année:

2003

Langue:

english

Fichier:

PDF, 296 KB

english, 2003

8

[Lecture Notes in Computer Science] The Semantic Web. Latest Advances and New Domains Volume 9678 ||

Sack, Harald, Blomqvist, Eva, d'Aquin, Mathieu, Ghidini, Chiara, Ponzetto, Simone Paolo, Lange, Christoph

Année:

2016

Langue:

english

Fichier:

PDF, 46.11 MB

english, 2016

9

TRIPS and Developing Countries || Access to genetic resources and benefit sharing: The Nagoya Protocol in the light of the TRIPS Agreement

Ghidini, Gustavo, Peritz, Rudolph, Ricolfi, Marco

Année:

2014

Langue:

english

Fichier:

PDF, 216 KB

english, 2014

10

Kritika: Essays on Intellectual Property ||

Ghidini, Gustavo, Ullrich, Hanns, Drahos, Peter

Année:

2017

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2017

11

O cuidado de enfermagem com o corpo sem vida

Nascimento, Maria Aparecida de Luca, Moraes, Marcelo de Paiva, Ghidini Junior, Rubens, Giannini, Ellen Lima

Journal:

Texto & Contexto - Enfermagem

Année:

2007

Fichier:

PDF, 153 KB

2007

12

Trapped charge and stress induced leakage current (SILC) in tunnel SiO2 layers of de-processed MOS non-volatile memory devices observed at the nanoscale

M. Lanza, M. Porti, M. Nafría, X. Aymerich, G. Ghidini, A. Sebastiani

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 443 KB

english, 2009

13

Local Models Semantics, or contextual reasoning=locality+compatibility

Chiara Ghidini, Fausto Giunchiglia

Journal:

Artificial Intelligence

Année:

2001

Langue:

english

Fichier:

PDF, 519 KB

english, 2001

14

Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides

M. Ceschia, A. Paccagnella, A. Scarpa, A. Cester, G. Ghidini

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 239 KB

english, 1999

15

Hydrophilic properties of aromatics

IGINO BONADEO, VERA LODI, D. GHIDINI

Journal:

International Journal of Cosmetic Science

Année:

1980

Langue:

english

Fichier:

PDF, 627 KB

english, 1980

16

[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - A Digitally Programmable On-Chip RC-Oscillator in 0.25μm CMOS Logic Process

Ghidini, C., Aranda, J.G., Gerna, D., Kelliher, K., Baumhof, C.

Année:

2005

Langue:

english

Fichier:

PDF, 223 KB

english, 2005

17

Evaluating Wiki Collaborative Features in Ontology Authoring

Di Francescomarino, Chiara, Ghidini, Chiara, Rospocher, Marco

Journal:

IEEE Transactions on Knowledge and Data Engineering

Année:

2014

Langue:

english

Fichier:

PDF, 1.37 MB

english, 2014

18

Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides

Ceschia, M., Paccagnella, A., Cester, A., Scarpa, A., Ghidini, G.

Journal:

IEEE Transactions on Nuclear Science

Année:

1998

Langue:

english

Fichier:

PDF, 863 KB

english, 1998

19

[IEEE IEEE 1995 International Integrated Reliability Workshop. Final Report - Lake Tahoe, CA, USA (22-25 Oct. 1995)] IEEE 1995 International Integrated Reliability Workshop. Final Report - F contamination effects on intrinsic and extrinsic gate oxide reliability

Ghidini, G., Drera, D., Maugain, F.

Année:

1995

Langue:

english

Fichier:

PDF, 484 KB

english, 1995

20

Ionizing radiation induced leakage current on ultra-thin gate oxides

Scarpa, A., Paccagnella, A., Montera, F., Ghibaudo, G., Pananakakis, G., Ghidini, G., Fuochi, P.G.

Journal:

IEEE Transactions on Nuclear Science

Année:

1997

Langue:

english

Fichier:

PDF, 791 KB

english, 1997

21

[Lecture Notes in Computer Science] Knowledge Engineering and Knowledge Management Volume 8982 || WebVOWL: Web-based Visualization of Ontologies

Lambrix, Patrick, Hyvönen, Eero, Blomqvist, Eva, Presutti, Valentina, Qi, Guilin, Sattler, Uli, Ding, Ying, Ghidini, Chiara

Année:

2015

Langue:

english

Fichier:

PDF, 427 KB

english, 2015

22

[Lecture Notes in Computer Science] The Semantic Web. Latest Advances and New Domains Volume 9678 || Distributed Context-Aware Applications by Means of Web of Things and Semantic Web Technologies

Sack, Harald, Blomqvist, Eva, d'Aquin, Mathieu, Ghidini, Chiara, Ponzetto, Simone Paolo, Lange, Christoph

Année:

2016

Langue:

english

Fichier:

PDF, 704 KB

english, 2016

23

[Lecture Notes in Computer Science] The Semantic Web. Latest Advances and New Domains Volume 9678 || RMLEditor: A Graph-Based Mapping Editor for Linked Data Mappings

Sack, Harald, Blomqvist, Eva, d'Aquin, Mathieu, Ghidini, Chiara, Ponzetto, Simone Paolo, Lange, Christoph

Année:

2016

Langue:

english

Fichier:

PDF, 554 KB

english, 2016

24

Dynamic competition in software development: how copyrights and patents, and their overlapping, impact on derivative innovation

Ghidini, Gustavo, Arezzo, Emanuela

Journal:

Queen Mary Journal of Intellectual Property

Année:

2013

Langue:

english

Fichier:

PDF, 186 KB

english, 2013

25

Fatigue properties of AlSi10Mg obtained by additive manufacturing: Defect-based modelling and prediction of fatigue strength

Romano, S., Brückner-Foit, A., Brandão, A., Gumpinger, J., Ghidini, T., Beretta, S.

Journal:

Engineering Fracture Mechanics

Année:

2017

Langue:

english

Fichier:

PDF, 5.94 MB

english, 2017

26

The Book of the Dead by Orikuchi Shinobu

Ghidini, Chiara

Journal:

Journal of Japanese Studies

Année:

2018

Langue:

english

Fichier:

PDF, 321 KB

english, 2018

27

âI Access Your Data, You Access Mineâ: Requiring Data Reciprocity in Payment Services

Di Porto, Fabiana, Ghidini, Gustavo

Journal:

IIC - International Review of Intellectual Property and Competition Law

Année:

2020

Fichier:

PDF, 334 KB

2020

28

[Lecture Notes in Business Information Processing] Business Process Management Forum Volume 392 (BPM Forum 2020, Seville, Spain, September 13â18, 2020, Proceedings) || Feature Development in BPMN-Based Process-Driven Applications

Fahland, Dirk, Ghidini, Chiara, Becker, JÃ¶rg, Dumas, Marlon

Année:

2020

Fichier:

PDF, 1.66 MB

2020

29

Critical reappraisal of the utility of sonographic fetal femur length in the prediction of trisomy 21

Patrizia Vergani, Anna Locatelli, Maria Giovanna Piccoli, Eloisa Mariani, Nicola Strobelt, John C. Pezzullo, Alessandro Ghidini

Journal:

Prenatal Diagnosis

Année:

2000

Langue:

english

Fichier:

PDF, 71 KB

english, 2000

30

Fracture mechanics and scale effects in the fatigue of railway axles

S. Beretta, A. Ghidini, F. Lombardo

Journal:

Engineering Fracture Mechanics

Année:

2005

Langue:

english

Fichier:

PDF, 980 KB

english, 2005

31

Fatigue life predictions using fracture mechanics methods

T. Ghidini, C. Dalle Donne

Journal:

Engineering Fracture Mechanics

Année:

2009

Langue:

english

Fichier:

PDF, 601 KB

english, 2009

32

Impact of interface and bulk trapped charges on transistor reliability

G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 196 KB

english, 2005

33

Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs

J. Martín-Martínez, S. Gerardin, R. Rodríguez, M. Nafría, X. Aymerich, A. Cester, A. Paccagnella, G. Ghidini

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 634 KB

english, 2007

34

Magnetic anisotropy of LaCo-substituted SrFe12O19 ferrites

G Asti, F Bolzoni, J.M Le Breton, M Ghidini, A Morel, M Solzi, F Kools, P Tenaud

Journal:

Journal of Magnetism and Magnetic Materials

Année:

2004

Langue:

english

Fichier:

PDF, 163 KB

english, 2004

35

Magnetic analysis of MnAs films grown on GaAs and Si substrates for potential spintronics and magnetocaloric applications

Massimo Solzi, Chiara Pernechele, Massimo Ghidini, Marco Natali, Marco Bolzan

Journal:

Journal of Magnetism and Magnetic Materials

Année:

2010

Langue:

english

Fichier:

PDF, 295 KB

english, 2010

36

Optimization of WSi2 by SiH4 CVD: impact on oxide quality

D. Brazzelli, G. Ghidini, C. Riva

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 134 KB

english, 2001

37

MOSFET parameter degradation after Fowler–Nordheim injection stress

A Candelori, E Gomiero, G Ghidini, A Paccagnella

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 149 KB

english, 1998

38

The impact of F contamination induced by the process on the gate oxide reliability

G Ghidini, C Clementi, D Drera, F Maugain

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 110 KB

english, 1998

39

Influence of charge trapping on oxide scaling down

G Ghidini, M Alessandri, C Clementi, F Pellizzer

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 225 KB

english, 1998

40

Analysis of space and energy distribution of stress-induced oxide traps

A.S. Spinelli, A.L. Lacaita, D. Minelli, G. Ghidini

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 197 KB

english, 1999

41

Degradation of electron irradiated MOS capacitors

A. Candelori, A. Paccagnella, A. Scarpa, G. Ghidini, P.G. Fuochi

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 202 KB

english, 1999

42

On the correlation between SILC and hole fluence throughout the oxide

A. Scarpa, B. De Salvo, G. Ghibaudo, G. Pananakakis, A. Paccagnella, G. Ghidini

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 153 KB

english, 1999

43

A recombination model for transient and stationary stress-induced leakage current

D Ielmini, A.S Spinelli, A.L Lacaita, A Martinelli, G Ghidini

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 204 KB

english, 2000

44

Perinatal outcome associated with oligohydramnios in uncomplicated term pregnancies

Anna Locatelli, Patrizia Vergani, Laura Toso, Maria Verderio, JohnC. Pezzullo, Alessandro Ghidini

Journal:

Archives of Gynecology and Obstetrics

Année:

2004

Langue:

english

Fichier:

PDF, 141 KB

english, 2004

45

Impact of the As dose in 0.35 μm EEPROM technology: characterization and modeling

N. Galbiati, G. Ghidini, C. Cremonesi, L. Larcher

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 272 KB

english, 2001

46

Stress induced degradation features of very thin gate oxides

A Scarpa, G Ghibaudo, G Ghidini, G Pananakakis, A Paccagnella

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 230 KB

english, 1998

47

Electrically and radiation induced leakage currents in thin oxides

A Scarpa, P Riess, G Ghibaudo, A Paccagnella, G Pananakakis, M Ceschia, G Ghidini

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 403 KB

english, 2000

48

Time decay of stress induced leakage current in thin gate oxides by low-field electron injection

A Cester, A Paccagnella, G Ghidini

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 119 KB

english, 2000

49

Electrical characterisation of oxides grown in different RTP ambients

D Brazzelli, G Ghidini, B Crivelli, R Zonca, M Bersani, G.C Xing, G.E Miner, N D’Astici, S Kuppurao, D Lopes

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 267 KB

english, 2000

50

Antenatal variables associated with severe adverse neurodevelopmental outcome among neonates born at less than 32 weeks

Anna Locatelli, Marianna Andreani, Agnese Pizzardi, Giuseppe Paterlini, Patrizia Stoppa, Alessandro Ghidini

Journal:

European Journal of Obstetrics & Gynecology and Reproductive Biology

Année:

2010

Langue:

english

Fichier:

PDF, 106 KB

english, 2010